Solar Cell Inspection
NANOVISTA is Intevac’s high speed, high resolution photovoltaic cell inspection system. Photoluminescence images of in-process materials and finished cells are collected at up to 3600 wph.
With its high throughput capability and proprietary, high sensitivity sensor technology, NANOVISTA captures 1.3 megapixel images in milliseconds with greater accuracy than other imaging systems. NANOVISTA interpretive software performs powerful image analysis using simple graphical tools. The data analysis can then be used to provide process monitoring, simple pass/fail criteria, or wafer grading.
- Proprietary imaging sensor captures entire silicon spectrum
- Whole wafer, high resolution photoluminescence mapping in milliseconds
- Identifies defective wafers for removal from the line
- Enables sorting of as-cut wafers by efficiency before processing
- Tighter process control increases yield, improves cell efficiency, reduces processing costs
